Biblioteca CNME

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Biblioteca: Aberration-corrected Analytical Electron Microscopy
Title:      Aberration-corrected Analytical Electron Microscopy
Categories:      Microscopía Electrónica
BookID:      27
Authors:     
ISBN-10(13):      978-0-470-51951-9
Publisher:      John Wiley & Sons
Publication date:      2011
Number of pages:      296
Language:      English
Price:      0.00
Rating:      0 
Picture:      cover
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